Aluminum nitride AlN thick film ceramic substrates pair a base material with 170–200 W/mK thermal conductivity to screen-printed conductor, resistor, and dielectric layers fired at 850–950 °C. The result is a circuit-ready substrate that moves heat 6–8× faster than 96% alumina while keeping the design flexibility of thick film patterning. For engineers evaluating aluminum nitride AlN thick film ceramic options, these substrates are the standard choice when a power device or high-brightness LED needs both efficient heat spreading and moderate circuit complexity on a single ceramic piece.

Thick film processing deposits conductor, resistor, and dielectric layers onto a fired ceramic substrate by screen printing metal-bearing pastes and then firing them in a belt furnace. On alumina, this is routine. On AlN, the process requires specific paste chemistries and a controlled atmosphere because AlN oxidizes above roughly 700 °C in air, forming an alumina surface layer that degrades both adhesion and thermal performance.
Most AlN-compatible thick film pastes use silver or gold conductors with glass frit binders formulated for nitrogen-atmosphere firing. Line widths of 100–150 µm and spaces of 100–125 µm are typical for production-grade screen printing. For finer features below 50 µm, a thin film metallization approach on AlN is more appropriate.
A typical thick film conductor stack on an aluminum nitride AlN thick film ceramic substrate looks like this: a printed Ag or Au layer (8–15 µm thick after firing), optionally overplated with nickel and gold for solderability. The fired adhesion strength should exceed 20 MPa per ASTM F1842 pull testing. Pastes from suppliers such as DuPont (now Heraeus Precious Metals) and Tanaka Kikinzoku publish adhesion data specific to AlN substrates.
| Parameter | Value | Unit | Condition | Source |
|---|---|---|---|---|
| Thermal conductivity | 170–200 | W/mK | 25 °C | Maruwa / Kyocera datasheets |
| Dielectric strength | 15–17 | kV/mm | 25 °C, 1 mm thick | CoorsTek AlN datasheet |
| Dielectric constant (εr) | 8.6–8.9 | — | 1 MHz, 25 °C | Kyocera SN-AlN |
| CTE | 4.4–4.7 | ppm/°C | 25–400 °C | Maruwa AN series |
| Flexural strength | 300–400 | MPa | 3-pt bend, ASTM C1161 | CoorsTek |
| Volume resistivity | >10¹⁴ | Ω·cm | 25 °C | Kyocera |
| Density | 3.26 | g/cm³ | — | Maruwa |
| Max continuous use temp (substrate) | 1 000 | °C | inert atmosphere | CoorsTek |
Typical values for commercially available material, for comparison only. Confirm against the datasheet for your specific grade.
One detail often overlooked: AlN’s thermal conductivity is sensitive to oxygen impurity levels in the sintered body. High-purity grades (>99%) reach 200 W/mK, while standard grades (~98%) may sit closer to 170 W/mK. Specify the grade, not just “AlN,” when sourcing substrates. Available ceramic substrate thicknesses for AlN typically range from 0.25 mm to 1.0 mm.
Enter your substrate dimensions, thickness, and power dissipation below to estimate junction temperature rise through an aluminum nitride AlN thick film ceramic substrate versus alumina.
Suppose you mount a 50 W power MOSFET (die size 5 mm × 5 mm) on a 0.635 mm thick AlN substrate. The conduction thermal resistance through the substrate is:
Rth = t / (k × A)
where t = 0.635 × 10⁻³ m, k = 180 W/mK, A = 25 × 10⁻⁶ m².
Rth = 0.635 × 10⁻³ / (180 × 25 × 10⁻⁶) = 0.14 °C/W.
At 50 W dissipation, the temperature drop across the substrate alone is 50 × 0.14 = 7.0 °C. The same calculation on 96% alumina (k = 25 W/mK) gives Rth = 1.02 °C/W and a 51 °C drop. That 44 °C difference is why AlN exists as a substrate material.
Both processes work on AlN, but they serve different design points. Thick film is the better fit when line widths above 100 µm are acceptable, when you need printed resistors on the same substrate, or when cost matters more than feature density. Thin film (sputtered Ti/Pt/Au or Ti/Cu/Ni/Au) wins when you need traces below 25 µm, tighter impedance control, or smoother surface finishes for flip-chip bonding.
For silver metallized ceramic substrates, thick film Ag on AlN offers the lowest-cost conductor option with good solderability, though silver migration under DC bias in humid environments remains a design concern above 5 V/mm spacing.

If your device dissipates under 5 W per cm² and junction temperature is not the binding constraint, 96% alumina thick film will perform adequately at one-third to one-fifth the substrate cost. For applications requiring extreme mechanical toughness and thermal cycling beyond 3 000 power cycles (ΔT > 150 °C), Si₃N₄ AMB substrates offer superior fracture toughness (6–7 MPa·m^½ vs. 2.5–3.5 for AlN) at higher cost. For sub-25 µm features, switch from thick film to thin film deposition. And if your circuit needs plated through-holes and multi-layer routing, an LTCC or standard PCB stackup is a better architecture than thick film on a monolithic ceramic.
Yes, provided the thick film conductor is topped with a solderable finish such as electroless nickel / immersion gold (ENIG) or plated Ni/Au. Bare fired silver is solderable with SnAgCu pastes, but wettability degrades after storage. A nickel barrier layer also prevents silver leaching into the solder joint.
Unprotected AlN slowly hydrolyzes in hot, humid environments, forming aluminum hydroxide on the surface. At 85 °C / 85% RH, measurable surface degradation can appear within 500 hours on unmetallized areas. Metallization and conformal coating effectively block moisture access. Design exposed AlN edges out of condensation zones or seal them.
Nitrogen with oxygen content below 10 ppm is standard. Firing in air above 700 °C oxidizes the AlN surface, weakening paste adhesion and forming a thermally resistive alumina interlayer. Gold pastes are more tolerant of residual oxygen than silver pastes, but nitrogen firing is recommended for both.
AlN thick film substrates are typically 30–50% less expensive than AlN DBC (direct bonded copper) for equivalent substrate sizes, because thick film avoids the high-temperature copper bonding step. However, DBC provides much thicker copper (0.2–0.3 mm) for higher current carrying capacity. Choose thick film for signal-level and moderate-current circuits; choose DBC when copper thickness above 50 µm is required.
The AlN ceramic itself is stable to 1 000 °C in inert atmosphere. The practical limit is set by the metallization: fired silver conductors are rated to roughly 300 °C, while gold conductors can operate to 500 °C. Solder joints (SnAgCu) limit most assemblies to 150–200 °C. Sintered silver die attach extends the assembly limit to about 300 °C.
If AlN thick film fits your thermal and electrical requirements, request a ceramic substrate sample kit to verify paste adhesion and solderability with your own assembly process before committing to production volumes.